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[IEEE 2013 International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Novosibirsk, Russia (2013.07.1-2013.07.5)] 2013 14th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - Stochastic resonance in VO2 thin films

✍ Scribed by Aliev, Vladimir Sh.; Bortnikov, Sergey G.; Gerasimova, Alina K.

Book ID: 121650957
Publisher: IEEE
Year: 2013
Weight: 616 KB
Category: Article
ISBN: 1479907618
DOI: 10.1109/EDM.2013.6641927

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