Lifetime calculations of MOSFETs using depth-dependent non-local impact ionization

✍ Scribed by M.J. van Dort; J.W. Slotboom; G. Streutker; P.H. Woerlee

• Publisher: Elsevier Science
• Year: 1995
• Tongue: English
• Weight: 295 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/0026-2692(95)98932-h