✦ LIBER ✦
Compact non-local modeling of impact ionization in SOI MOSFETs for optimal CMOS device/circuit design
✍ Scribed by S Krishnan; J.G Fossum
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 711 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0038-1101
No coin nor oath required. For personal study only.