Lifetime and drift velocity analysis for electromigration in sputtered Al films, multilayers, and alloys

✍ Scribed by B. Grabe; H.-U. Schreiber

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 845 KB
• Volume: 26
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(83)90080-1