Lifetime and drift velocity analysis for electromigration in sputtered Al films, multilayers and alloys : B. Grabe and H.-U. Shreiber. Solid-St. Electron.26 (10), 1023 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 126 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90392-5