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Leakage sources and possible solutions in nanometer CMOS technologies

✍ Scribed by Elgharbawy, W.M.; Bayoumi, M.A.

Book ID: 115541001
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 812 KB
Volume: 5
Category: Article
ISSN: 1531-636X
DOI: 10.1109/mcas.2005.1550165

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