Leakage Minimization of Digital Circuits Using Gate Sizing in the Presence of Process Variations

[ACM Press the 41st annual conference -

[ACM Press the 41st annual conference - San Diego, CA, USA (2004.06.07-2004.06.11)] Proceedings of the 41st annual conference on Design automation - DAC '04 - Statistical optimization of leakage power considering process variations using dual-Vth and sizing

✍ Srivastava, Ashish; Sylvester, Dennis; Blaauw, David 📂 Article 📅 2004 🏛 ACM Press 🌐 English ⚖ 380 KB

Design Automation Conference : 41st Dac : San Diego Convention Center, San Diego, Ca, June 7-11, 2004 : Sponsored By Acm ... [et Al.]. Cover Title. Acm Order Number 477040 ; Ieee Catalog Number 04ch37531--p. Ii. Includes Bibliographical References And Author Index. Also Issued Online Via The Acm Dig

Minimizing variation in the electrical c

Minimizing variation in the electrical characteristics of gate-all-around thin film transistors through the use of multiple-channel nanowire and NH3 plasma treatment

✍ Po-Chun Huang; Lu-An Chen; Chen-Chia Chen; Jeng-Tzong Sheu 📂 Article 📅 2012 🏛 Elsevier Science 🌐 English ⚖ 645 KB

[IEEE Comput. Soc. Press European Design

[IEEE Comput. Soc. Press European Design Automation Conference, 1990., EDAC. - Glasgow, UK (12-15 March 1990)] Proceedings of the European Design Automation Conference, 1990., EDAC. - Gate sizing in MOS digital circuits with linear programming

✍ Berkelaar, Michel R.C.M. (author);Jess, Jochen A.G. (author) 📂 Article 📅 1990 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 363 KB

[IEEE Comput. Soc. Press European Design

[IEEE Comput. Soc. Press European Design Automation Conference, 1990., EDAC. - Glasgow, UK (12-15 March 1990)] Proceedings of the European Design Automation Conference, 1990., EDAC. - Gate sizing in MOS digital circuits with linear programming

✍ Berkelaar, Michel R.C.M. (author);Jess, Jochen A.G. (author) 📂 Article 📅 1990 🏛 Institute of Electrical and Electronics Engineers 🌐 English ⚖ 363 KB

[IEEE 2009 IEEE International Conference

[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Accurate estimation of vector dependent leakage power in the presence of process variations

✍ Fernandes, Romana; Vemuri, Ranga 📂 Article 📅 2009 🏛 IEEE ⚖ 384 KB

[ACM Press the 39th conference - New Orl

[ACM Press the 39th conference - New Orleans, Louisiana, USA (2002.06.10-2002.06.14)] Proceedings of the 39th conference on Design automation - DAC '02 - Dynamic and leakage power reduction in MTCMOS circuits using an automated efficient gate clustering technique

✍ Anis, Mohab; Mahmoud, Mohamed; Elmasry, Mohamed; Areibi, Shawki 📂 Article 📅 2002 🏛 ACM Press 🌐 English ⚖ 203 KB

Sponsored By Acm ... [et Al.]. Cover Title. Acm Order Number 477020 ; Ieee Catalog Number 02ch37324--t.p. Verso. Includes Bibliographical References And Author Index. Also Available On The World Wide Web Via Acm Digital Library With Title: Proceedings Of The 39th Conference On Design Automation, 200