Layout-dependent STI stress analysis and stress-aware RF/analog circuit design optimization

✍ Scribed by Xue, Jiying (author);Ye, Zuochang (author);Deng, Yangdong (author);Wang, Hongrui (author);Yang, Liu (author);Yu, Zhiping (author)

• Book ID: 115482209
• Publisher: Institute of Electrical and Electronics Engineers Inc.
• Year: 2009
• Weight: 428 KB
• Category: Article
• ISBN: 1605588008
• ISSN: 1092-3152
• DOI: 10.1145/1687399.1687497