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[ACM Press the 2009 International Conference - San Jose, California (2009.11.02-2009.11.05)] Proceedings of the 2009 International Conference on Computer-Aided Design - ICCAD '09 - Layout-dependent STI stress analysis and stress-aware RF/analog circuit design optimization

โœ Scribed by Xue, Jiying; Ye, Zuochang; Deng, Yangdong; Wang, Hongrui; Yang, Liu; Yu, Zhiping


Book ID
115482208
Publisher
ACM Press
Year
2009
Weight
428 KB
Volume
0
Category
Article
ISBN
1605588008

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Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has been aimed at handling parameter variations as part of timing analysis, few proposals have actually included ways to in