๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

[ACM Press the 2009 International Conference - San Jose, California (2009.11.02-2009.11.05)] Proceedings of the 2009 International Conference on Computer-Aided Design - ICCAD '09 - Modeling of layout-dependent stress effect in CMOS design

โœ Scribed by Wang, Chi-Chao; Zhao, Wei; Liu, Frank; Chen, Min; Cao, Yu


Book ID
115482207
Publisher
ACM Press
Year
2009
Weight
812 KB
Volume
0
Category
Article
ISBN
1605588008

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


[ACM Press the 2009 International Confer
โœ Heloue, Khaled R.; Kashyap, Chandramouli V.; Najm, Farid N. ๐Ÿ“‚ Article ๐Ÿ“… 2009 ๐Ÿ› ACM Press โš– 279 KB

Process and environmental variations continue to present significant challenges to designers of high-performance integrated circuits. In the past few years, while much research has been aimed at handling parameter variations as part of timing analysis, few proposals have actually included ways to in