Layered Intergrowth Phases Bi4MO8X (X=Cl, M=Ta and X=Br, M=Ta or Nb): Structural and Electrophysical Characterization
β Scribed by Ardak M. Kusainova; Wuzong Zhou; John T.S. Irvine; Philip Lightfoot
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 406 KB
- Volume
- 166
- Category
- Article
- ISSN
- 0022-4596
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β¦ Synopsis
The high-temperature structural behavior of the layered intergrowth phase Bi 4 TaO 8 Cl, belonging to the SilleH n-Aurivillius family, has been studied by powder neutron di4raction. This material is ferroelectric, space group P2 1 cn, at T C (640 K. An order8 disorder transition to centrosymmetric space group Pmcn is found around 640 K, which involves disordering of TaO 6 octahedral tilts. A second phase transition, of a 5rst-order nature, to space group P4/mmm occurs at a temperature of &1038 K. The crystal structures of the bromide analogs Bi 4 MO 8 Br (M β«Ψβ¬ Nb, Ta) have also been determined at room temperature; both are isomorphous with Bi 4 TaO 8 Cl and exhibit maxima in dielectric constant at temperatures of approximately 588 and 450 K, respectively. ^2002 Elsevier Science (USA)
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