Lattice constant determination by grazing incidence diffraction in thin cubic films under thermal strain

Determination of Stress Tensors in thin

Determination of Stress Tensors in thin textured copper films by grazing incidence diffraction

✍ Dipl.-Ing. J. Zendehroud; Dr. Th. Wieder; Dr. H. Klein 📂 Article 📅 1995 🏛 John Wiley and Sons 🌐 English ⚖ 753 KB

## Abstract Ion‐platted thin copper films were examined for residual stresses and texture by X‐ray diffraction. The complete orientation distribution functions were determined and sharp (111)‐fibre textures were found. The strains were measured by grazing incidence diffraction. The stress tensors w