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Lateral resolution improvement in two-photon excitation microscopy by aperture engineering

✍ Scribed by Partha Pratim Mondal; Alberto Diaspro

Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 471 KB
Volume: 281
Category: Article
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2007.09.067

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