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Improving the lateral resolution in confocal fluorescence microscopy using laterally interfering excitation beams

✍ Scribed by Olivier Haeberlé; Bertrand Simon

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 306 KB
Volume: 259
Category: Article
ISSN: 0030-4018
DOI: 10.1016/j.optcom.2005.09.004

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