An analysis of the contact mechanics and the forces of interaction in lateral force microscopy measurements is presented. This analysis allows for a new method of interpretation of the frictional forces, the lateral contact stiffness, and the contact shear strength. The technique was developed for t
Lateral-force measurements in dynamic force microscopy
✍ Scribed by Pfeiffer, O.; Bennewitz, R.; Baratoff, A.; Meyer, E.; Grütter, P.
- Book ID
- 123618324
- Publisher
- The American Physical Society
- Year
- 2002
- Tongue
- English
- Weight
- 333 KB
- Volume
- 65
- Category
- Article
- ISSN
- 1098-0121
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