Laser-induced self-organization in silicon-germanium thin films
✍ Scribed by Weizman, M.; Nickel, N. H.; Sieber, I.; Yan, B.
- Book ID
- 111656949
- Publisher
- American Institute of Physics
- Year
- 2008
- Tongue
- English
- Weight
- 991 KB
- Volume
- 103
- Category
- Article
- ISSN
- 0021-8979
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## Abstract The defect properties of laser‐crystallized polycrystalline silicon–germanium (Si–Ge) thin films on glass substrates were investigated with electron spin resonance (ESR) and conductivity measurements. The ESR measurements reveal that laser‐crystallized poly Si~1−__x__~Ge~__x__~ thin fil
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