Orientation dependence of grain-boudary
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G. Garz; T. Schild; N. Bouadma; F.R. Ladan; P. Gabelotaud; C. Gonzalez
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Article
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1994
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Elsevier Science
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English
β 171 KB
The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of t