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Laser-induced modification of the critical current in Y-Ba-Cu-O step-edge Josephson junctions

✍ Scribed by Roman Adam; Witold Kula; J. M. Murduck; C. Pettiette-Hall; Roman Sobolewski


Book ID
112782077
Publisher
Springer
Year
1996
Tongue
English
Weight
157 KB
Volume
46
Category
Article
ISSN
0011-4626

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The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of t