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Large-Signal Analysis of a Transistor Laser

✍ Scribed by Shirao, M.; SeungHun Lee; Nishiyama, N.; Arai, S.


Book ID
114565898
Publisher
IEEE
Year
2011
Tongue
English
Weight
708 KB
Volume
47
Category
Article
ISSN
0018-9197

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## Abstract In this article, we present an accurate characterization of the RF LDMOSFET transistors for the extracting of the large‐signal model. They are generally available encapsulated in package. A measurement of the package parameters are made only by removing the semiconductor chip. The trans