<p><p></p><p>This book brings together a selection of the best papers from the twentiethedition of the Forum on specification and Design Languages Conference (FDL), which took place on September 18-20, 2017, in Verona, Italy. FDL is a well-established international forum devoted to dissemination of
Languages, Design Methods, and Tools for Electronic System Design: Selected Contributions from FDL 2016
β Scribed by Franco Fummi, Robert Wille (eds.)
- Publisher
- Springer International Publishing
- Year
- 2018
- Tongue
- English
- Leaves
- 122
- Series
- Lecture Notes in Electrical Engineering 454
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
This book brings together a selection of the best papers from the nineteenth edition of the Forum on specification and Design Languages Conference (FDL), which took place on September 14-16, 2016, in Bremen, Germany. FDL is a well-established international forum devoted to dissemination of research results, practical experiences and new ideas in the application of specification, design and verification languages to the design, modeling and verification of integrated circuits, complex hardware/software embedded systems, and mixed-technology systems.
β¦ Table of Contents
Front Matter ....Pages i-vii
Knowing Your AMS Systemβs Limits: System Acceptance Region Exploration by Using Automated Model Refinement and Accelerated Simulation (Georg GlΓ€ser, Hyun-Sek Lukas Lee, Markus Olbrich, Erich Barke)....Pages 1-14
Designing Reliable Cyber-Physical Systems (Gadi Aleksandrowicz, Eli Arbel, Roderick Bloem, Timon D. ter Braak, Sergei Devadze, Goerschwin Fey et al.)....Pages 15-38
On the Application of Formal Fault Localization to Automated RTL-to-TLM Fault Correspondence Analysis for Fast and Accurate VP-Based Error Effect Simulation: A Case Study (Vladimir Herdt, Hoang M. Le, Daniel GroΓe, Rolf Drechsler)....Pages 39-57
Error-Based Metric for Cross-Layer Cut Determination (A. Rafiev, F. Xia, A. Iliasov, R. Gensh, A. Aalsaud, A. Romanovsky et al.)....Pages 59-82
Feature-Based State Space Coverage Metric for Analog Circuit Verification (Andreas FΓΌrtig, Sebastian Steinhorst, Lars Hedrich)....Pages 83-101
Error-Free Near-Threshold Adiabatic CMOS Logic in the Presence of Process Variation (Yue Lu, Tom J. Kazmierski)....Pages 103-114
Back Matter ....Pages 115-116
β¦ Subjects
Circuits and Systems
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