๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Langmuir-Blodgett resist films for microlithography by exposure to a scanning electron microscope

โœ Scribed by W. Lu; N. Gu; Z.H. Lu; X.M. Yang; Y. Wei; H.Y. Shen; L. Zhang


Book ID
103428503
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
369 KB
Volume
242
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Fracture resistance evaluation of RuO2-b
โœ Niko Sebastian Dorsch; Ilya Peshekhodov; Philipp Spies; Gerold A. Schneider ๐Ÿ“‚ Article ๐Ÿ“… 2008 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 663 KB

Parameters for the fracture mechanics of thick film materials are scarce in the literature. One reason is that for many such materials it is very difficult to produce a bulk specimen as required for most standard tests. This paper describes an alternative method for measuring the fracture resistance