Lamellar thickening of polyethylene unde
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Munehisa Yasuniwa; Shinsuke Tsubakihara; Masashi Yamaguchi
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Article
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1997
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John Wiley and Sons
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English
โ 188 KB
๐ 2 views
Single crystal mat (SCM) samples of polyethylene (PE) were prepared from dilute solution of p-xylen, then they were annealed at pressures of 200 and 500 MPa. Lamellar thickness of the original and annealed SCM samples was measured by smallangle X-ray scattering method. Orientation of the molecular c