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La Cybernétique || The Philosophy of Science of A. S. Eddingtonby John W. Yolton; F. Gonseth

✍ Scribed by Review by: Gérard Deledalle

Book ID
124819129
Publisher
Presses Universitaires de France
Year
1961
Tongue
French
Weight
189 KB
Volume
16
Category
Article
ISSN
0014-2166

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Determination of the density of ultrathi
Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves
✍ Makhotkin, I. A. ;Louis, E. ;van de Kruijs, R. W. E. ;Yakshin, A. E. ;Zoethout, 📂 Article 📅 2011 🏛 John Wiley and Sons 🌐 English ⚖ 501 KB

## Abstract Using simultaneous analysis of both the grazing incidence X‐ray reflectivity (GIXR) and the angular dependent fluorescence yield from ultrathin layer structures, the densities of thin La and LaN layers of 2–6 nm thickness enclosed by B~4~C layers have been determined with approximately