Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves

✍ Scribed by Makhotkin, I. A. ;Louis, E. ;van de Kruijs, R. W. E. ;Yakshin, A. E. ;Zoethout, E. ;Seregin, A. Yu. ;Tereschenko, E. Yu. ;Yakunin, S. N. ;Bijkerk, F.

• Book ID: 105366649
• Publisher: John Wiley and Sons
• Year: 2011
• Tongue: English
• Weight: 501 KB
• Volume: 208
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.201184256

✦ Synopsis

Abstract

Using simultaneous analysis of both the grazing incidence X‐ray reflectivity (GIXR) and the angular dependent fluorescence yield from ultrathin layer structures, the densities of thin La and LaN layers of 2–6 nm thickness enclosed by B~4~C layers have been determined with approximately 5% precision. The density of the La layer in these systems is found to be reduced to the bulk La value. This is explained by LaB~6~ interlayers formation. The density of LaN layers were similar to the bulk LaN value, which favors this compound as the most energetically stable in LaN/B~4~C layered systems.