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Kinetics of light-induced defect creation in amorphous silicon: The constant degradation method

✍ Scribed by Martin S. Brandt; Martin Stutzmann

Book ID: 117146971
Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 290 KB
Volume: 137-138
Category: Article
ISSN: 0022-3093
DOI: 10.1016/s0022-3093(05)80093-6

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