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Kinetics and crystallization studies by in situ X-ray diffraction of the oxidation of chemically vapour deposited SiC

✍ Scribed by F. Sibieude; J. Rodríguez; M.T. Clavaguera-Mora

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 714 KB
Volume: 204
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(91)90507-t

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