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Kelvin probe force microscopy of hole leakage from the active region of a working injection-type semiconductor laser diode

✍ Scribed by A. V. Ankudinov; V. P. Evtikhiev; K. S. Ladutenko; A. N. Titkov; R. Laiho

Book ID: 111443596
Publisher: Springer
Year: 2006
Tongue: English
Weight: 232 KB
Volume: 40
Category: Article
ISSN: 1063-7826
DOI: 10.1134/s1063782606080185

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