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Joint design and test consideration in high frequency circuits

✍ Scribed by Iboun-Taimiya Sylla; Mustapha Slamani; Bozena Kaminska; Fadhel Ghannouchi

Publisher
John Wiley and Sons
Year
1997
Tongue
English
Weight
222 KB
Volume
16
Category
Article
ISSN
0895-2477

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✦ Synopsis

Radiofrequency RF systems technology is continually pushing maximum operating frequencies upward. This constrains manufacturers of RF products to specify their circuits in terms of scattering parameters. Integrating design and test is one of the highly desirable analog systems requirements. In this paper, a frequency domain analysis of RF systems is performed. This analysis is intended to ameliorate the design performances and to facilitate the test of a gi¨en product especially integrated circuits. It helps a design engineer to determine parameters that influence the circuit performance and the best topology that can be used to help impro¨e this performance. On the other hand, it helps a test engineer to plan test strategy and to predict which elements can be isolated by a gi¨en test set. By this analysis, we determine the correlation between the different components in a circuit and their conjoint influence on the output.

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## Abstract Recently current testing is beginning to be noticed as a testing method for CMOS circuits. However, since CMOS circuits cause the dynamic current due to switching, it has been pointed out that testing at a fast clock rate by current testing is difficult. To cope with this problem a buil