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Isotopic Analysis of Silicon by Solid-Source Mass Spectrometry using Negative Ions

✍ Scribed by NEWTON, D. C.; SANDERS, J.; TYRRELL, A. C.

Book ID
109610678
Publisher
Nature Publishing Group
Year
1960
Tongue
English
Weight
109 KB
Volume
187
Category
Article
ISSN
0028-0836

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## Abstract A new technique using negative‐ion fast atom bombardment mass spectrometry for the analysis of xanthates and related compounds is described. Electron impact and positive‐ion fast atom bombardment mass spectrometry produced no structurally related fragment ions or observable molecular io