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Irradiation-induced defects in thin aluminium films studied by 1/f noise

โœ Scribed by Briggmann, J. ;Dagge, K. ;Frank, W. ;Seeger, A. ;Stoll, H. ;Verbruggen, A. H.

Book ID
105384405
Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
676 KB
Volume
146
Category
Article
ISSN
0031-8965

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โœ C.L. Lin; C.C. Chi; C.C. Chen; M.K. Wu ๐Ÿ“‚ Article ๐Ÿ“… 1994 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 159 KB

We present our stud.,,, of l/f nmse m YBa2Cu30 \ (YBCO) tlun films that ha\ e dlstmctlx c rcs~sh|nce charactensUcs due to d~fferenl oxTgen deficiency We observe that the nmse behavior is not s~gmficantl.~ dependen! on oxTgcn concentration and appears to be uncorrelated wflh the temperature dependenc