✦ LIBER ✦

[IRE 1986 International Electron Devices Meeting - ()] 1986 International Electron Devices Meeting - Parasitic resistance characterization for optimum design of half micron MOSFETs

✍ Scribed by Noguchi, T.; Asahi, Y.; Ikeda, N.; Maeguchi, K.; Kanzaki, K.

No coin nor oath required. For personal study only.

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