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[IRE 1980 International Electron Devices Meeting - ()] 1980 International Electron Devices Meeting - Experimental and theoretical characterization of submicron MOSFETs

✍ Scribed by Fichtner, W.; Fuls, E.N.; Johnston, R.L.; Sheng, T.T.; Watts, R.K.

No coin nor oath required. For personal study only.

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