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[IRE 1974 International Electron Devices Meeting (IEDM) - Washigton, DC, USA (1974.12.9-1974.12.11)] 1974 International Electron Devices Meeting (IEDM) - A new concept of ballasting mechanisms of microwave power transistors in class C operation

โœ Scribed by Sayed, M.M.; Chen, J.T.C.; Kakihana, S.


Book ID
118230651
Publisher
IRE
Year
1974
Weight
402 KB
Category
Article

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