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IR spectroscopic investigation of SiO2 film structure

✍ Scribed by I.P. Lisovskii; V.G. Litovchenko; V.G. Lozinskii; G.I. Steblovskii

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 499 KB
Volume: 213
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(92)90278-j

No coin nor oath required. For personal study only.

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