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Ion induced Auger spectroscopy

✍ Scribed by E.W. Thomas; K.O. Legg; W.A. Metz


Publisher
Elsevier Science
Year
1980
Weight
349 KB
Volume
168
Category
Article
ISSN
0029-554X

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The inΓ‘uence of high-energy Si' irradiation on carbon-implanted silicon at low temperature was studied. C' Ions of kinetic energy 25 keV were implanted into Si(100) at room temperature with a dose density of 1 Γ‚ 1017 ions cm-2 after amorphization of the surface region by Ge' implantation at 200 keV.