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Ion implantation and SIMS profiling of impurities in II-VI materials (HgCdTe and CdTe)

✍ Scribed by R.G. Wilson

Publisher: Elsevier Science
Year: 1988
Tongue: English
Weight: 755 KB
Volume: 86
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(90)90800-z

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