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Ion electron emission microscopy at the SIRAD single event effect facility

✍ Scribed by D. Bisello; A. Kaminsky; A. Magalini; M. Nigro; D. Pantano; S. Sedykh; J. Wyss

Book ID: 114164769
Publisher: Elsevier Science
Year: 2001
Tongue: English
Weight: 118 KB
Volume: 181
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(01)00462-1

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