Ion electron emission microscopy at SIRAD

✍ Scribed by D. Bisello; A. Candelori; P. Giubilato; A. Kaminsky; S. Mattiazzo; M. Nigro; D. Pantano; R. Rando; M. Tessaro; J. Wyss; S. Bertazzoni; D. Di Giovenale

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 188 KB
• Volume: 231
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2005.01.036