The cross sections for simple and dissociative ionization of tetramethylsilane ((CHa)4Si or TMS) by electron impact have been measured using Fourier-transform mass spectrometry. The total ionization cross section is 8.5 Γ 10-~6 cm 2 between 30 and 70 eV. The molecular ion is Jahn-Teller unstable, wi
β¦ LIBER β¦
Ion chemistry in tetraethylorthosilicate (C2H5O)4Si
β Scribed by J. Holtgrave; K. Riehl; D. Abner; P.D. Haaland
- Book ID
- 103030836
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 463 KB
- Volume
- 215
- Category
- Article
- ISSN
- 0009-2614
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β¦ Synopsis
The cross sections for simple and dlssoclatlve lomzatlon of tetraethoxyorthoslhcate ( ( CIHSO ),d or TEOS) by electron impact have been measured using Fourier-transform mass spectrometry The total lomzatlon cross section 1s (2 5 + 0 5) x 10-Ls cm2 between 20 and 50 eV Stolchlometnes of the cations were asslgned by high-resolution mass spectra, and the reactlons of TEOS fragment ions wth neutral TEOS have been analyzed Hrlth double resonance methods No amens were detected from 10 to 50 eV
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