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Ion beam induced mixing of the Cu/Si system using electrical resistivity and RBS measurements

โœ Scribed by El-Haija, A. J. Abu ;Al-Saleh, K. A. ;Halim, N. A. ;Khalifeh, J. M. ;Saleh, N. S.


Publisher
John Wiley and Sons
Year
1988
Tongue
English
Weight
441 KB
Volume
107
Category
Article
ISSN
0031-8965

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