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Ion beam analysis of rough thin films

✍ Scribed by M. Mayer

Book ID: 114165821
Publisher: Elsevier Science
Year: 2002
Tongue: English
Weight: 876 KB
Volume: 194
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(02)00689-4

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