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Ion beam analysis of rare earth nitride thin films

✍ Scribed by J. Kennedy; S. Granville; A. Markwitz; B.J. Ruck; H.J. Trodahl

Book ID: 108224187
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 219 KB
Volume: 266
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2008.01.052

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