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Ion beam analysis of oxidised a-C:D layers on Be — A comparison of 4He RBS and 28Si ERD analysis

✍ Scribed by J. Roth; D.S. Walsh; W.R. Wampler; M. Mayer

Book ID: 114169704
Publisher: Elsevier Science
Year: 1998
Tongue: English
Weight: 548 KB
Volume: 136-138
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(97)00774-x

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