✦ LIBER ✦
Nitridation of Silicon Oxide Layers Studied with Ion Beam Analysis on the Nanometer Scale
✍ Scribed by A. Markwitz; G. V. White
- Publisher
- John Wiley and Sons
- Year
- 2001
- Tongue
- English
- Weight
- 153 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0935-9648
No coin nor oath required. For personal study only.