✦ LIBER ✦

Ion beam analysis of defects and strain in swift heavy ion irradiated InGaAs/GaAs heterostructures

✍ Scribed by S. Dhamodaran; N. Sathish; A.P. Pathak; D.K. Avasthi; R. Muralidharan; B. Sundaravel; K.G.M. Nair; D.V. Sridhara Rao; K. Muraleedharan; D. Emfietzoglou

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 567 KB
Volume: 254
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2006.10.075

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

High-resolution XRD analysis of swift he

High-resolution XRD analysis of swift heavy ion irradiated InGaAs/GaAs heterostructures

✍ S. Dhamodaran; N. Sathish; A.P. Pathak; S.A. Khan; D.K. Avasthi; T. Srinivasan; 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 686 KB

RBS/channeling studies of swift heavy io

RBS/channeling studies of swift heavy ion irradiated InGaAs/GaAs heterostructures

✍ S. Dhamodaran; N. Sathish; A.P. Pathak; S.A. Khan; D.K. Avasthi; T. Srinivasan; 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 184 KB

Surface modification of InGaAs/GaAs hete

Surface modification of InGaAs/GaAs heterostructures by swift heavy ion irradiation

✍ S. Dhamodaran; A.P. Pathak; D.K. Avasthi; T. Srinivasan; R. Muralidharan; D. Emf 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 1005 KB

We investigate the surface morphology of molecular beam epitaxy (MBE) grown InGaAs/GaAs(0 0 1) heterostructures using atomic force microscope (AFM) before and after irradiation. Samples with layer thicknesses below critical layer thickness (i.e. fully strained) have smooth surface where as, the samp

Swift heavy ion beam irradiation induced

Swift heavy ion beam irradiation induced modifications in structural, morphological and optical properties of CdS thin films

✍ S. Chandramohan; R. Sathyamoorthy; P. Sudhagar; D. Kanjilal; D. Kabiraj; K. Asok 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 635 KB

In situ and postradiation analysis of me

In situ and postradiation analysis of mechanical stress in Al2O3:Cr induced by swift heavy-ion irradiation

✍ V.A. Skuratov; G. Bujnarowski; Yu.S. Kovalev; J. O’Connell; K. Havanscak 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 752 KB

Optical spectroscopy and TEM techniques have been applied to study the radiation damage and correlated mechanical stresses in Al 2 O 3 and Al 2 O 3 :Cr single crystals induced by (1-3) MeV/amu Kr, Xe and Bi ion irradiation. Mechanical stresses were evaluated in situ using a piezospectroscopic effect