Ion beam analysis of Cs-implanted zirconia and spinel

✍ Scribed by L. Thomé; A. Gentils; S.E. Enescu; H. Khodja; T. Thomé

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 426 KB
• Volume: 249
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.04.060

✦ Synopsis

Fission products (Cs) were introduced into yttria-stabilized zirconia (YSZ) and magnesium aluminate spinel (MAS) single crystals by room temperature ion implantation. The effect of high-temperature annealing on the depth distribution of implanted species and the surface homogeneity of crystals were investigated by the combination of AFM and RBS using a macro-and a micro-ion beam. The diffusion and release of Cs involve mechanisms which depend on the material and Cs concentration. In YSZ Cs desorbs out of the crystal at lower temperature ($550 °C) than in MAS ($850 °C). In YSZ the surface of the sample remains unaltered when Cs desorption occurs, whereas in MAS Cs desorption is accompanied by the exfoliation of the sample surface.