Ion attachment to van der Waals clusters
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M. Lezius; P. Scheier; T.D. Märk
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Article
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1992
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Elsevier Science
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English
⚖ 414 KB
A new method is described of rendering ionized neutral van der Waals clusters. This involves the association of NO + ions to a neutral argon cluster beam in a Nier-type ion source. This new (and alternative to electron and photon) ionization mode appears to be softer than electron impact ionization