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Investigations on trapped flux in cryogenic continuous film memory cells

✍ Scribed by Kadereit, H.

Book ID: 117920392
Publisher: IEEE
Year: 1966
Tongue: English
Weight: 560 KB
Volume: 2
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.1966.1065841

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