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Investigations on structural evolution and dielectric characteristics of high performance Bi-based dielectrics

โœ Scribed by Huiling Du; Xi Yao


Book ID
113785520
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
203 KB
Volume
40
Category
Article
ISSN
0025-5408

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High-temperature X-ray structural, therm
โœ K. V. R. Prasad; K. B. R. Varma ๐Ÿ“‚ Article ๐Ÿ“… 1995 ๐Ÿ› Springer ๐ŸŒ English โš– 406 KB

The X-ray powder diffraction, dielectric and thermal studies of bismuth vanadate (Bi2VOs.s) ceramic have been carried but as a function of temperature (300-900 K). The hightemperature X-ray studies, supported by differential scanning calorimetry, clearly demonstrate that Bi2VOs.~ undergoes two major