✦ LIBER ✦
ChemInform Abstract: Structural Evolution and Point Defects in Metal Oxide-Based High-k Gate Dielectrics
✍ Scribed by Paul C. McIntyre; Hyoungsub Kim; Krishna C. Saraswat
- Publisher
- John Wiley and Sons
- Year
- 2009
- Weight
- 15 KB
- Volume
- 40
- Category
- Article
- ISSN
- 0931-7597
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