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Investigations on electrical properties of a-C:H thin films deposited in a Microwave Multipolar Plasma reactor excited at Distributed Electron Cyclotron Resonance

โœ Scribed by Kihel, M.; Clergereaux, R.; Escaich, D.; Calafat, M.; Raynaud, P.; Sahli, S.; Segui, Y.


Book ID
123207494
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
366 KB
Volume
17
Category
Article
ISSN
0925-9635

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## Abstract Microcrystalline silicon films were deposited in a matrix distributed electron cyclotron resonance (MDECR) plasma enhanced chemical vapor deposition (PECVD) system using pure silane, under varying substrate bias conditions. Microstructural characterization of the films shows a lower voi